The third EMVA Forum ‘Control Vision Talks’ for Machine Vision and Optical Metrology at Control 2018 will take place during the 32nd Control, the international trade fair for quality assurance held in Stuttgart from 24 to 26 April.
The presentation forum is organised by Control show organizer PE Schall and the European Machine Vision Association. They say that the ‘Control Vision Talks’ aim to demonstrate the advantages of machine vision and optical metrology for quality assurance in an application-oriented manner.
They will be held during the first three show days and offer more than 30 presentations on applied machine vision and optical metrology for quality assurance in German or English language. Each of the days has a special thematic priority:
Tuesday, 24 April: Machine Vision: From 2D to 3D
Wednesday, 25 April: Optical Metrology: From Offline to Inline
Thursday, 26 April: Spectral Imaging: Hyperspectral, CT and Infrared
The program is supplemented by a panel discussion titled ´Inline computer tomography: Myth or Reality´ in German language on Wednesday, 25 April at noon.